— This paper proposes a low-complexity model for vertical antenna radiation patterns, e.g. for inclusion in systemlevel simulations. They can be seen as extensions to the horizon...
Fredrik Gunnarsson, Martin N. Johansson, Anders Fu...
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...
James Dardig, Haralampos-G. D. Stratigopoulos, Eri...
—High node mobility and transient connectivity in Vehicular Ad Hoc NETworks have introduced numerous challenges in the design of efficient communication protocols for these netwo...
: The concept of interface in Ada 2005 significantly facilitates its usage as the basis for a software components technology. This technology, taking benefit of the resources that ...