Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
The increasing use of computers for saving valuable data imposes stringent reliability constraints on storage systems. Reliability improvement via use of redundancy is a common pr...
We have developed Argus, a novel approach for providing low-cost, comprehensive error detection for simple cores. The key to Argus is that the operation of a von Neumann core cons...
Memory state can be corrupted by the impact of particles causing single-event upsets (SEUs). Understanding and dealing with these soft (or transient) errors is important for syste...
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...