32 search results - page 3 / 7 » Impact of Multiple-Detect Test Patterns on Product Quality |
ICSE
2003
IEEE-ACM
14 years 7 months ago
2003
IEEE-ACM
In a software development group of IBM Retail Store Solutions, we built a non-trivial software system based on a stable standard specification using a disciplined, rigorous unit t...
SWSTE
2005
IEEE
14 years 29 days ago
2005
IEEE
We present a new automated software acceptance tests framework. The framework is novel in supporting the entire lifecycle and all QA activities, including test maintenance over mu...
ICCAD
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. ...
ICS
2011
Tsinghua U.
12 years 11 months ago
2011
Tsinghua U.
Suppose one is considering purchase of a computer equipped with accelerators. Or suppose one has access to such a computer and is considering porting code to take advantage of the...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...