32 search results - page 4 / 7 » Impact of Multiple-Detect Test Patterns on Product Quality |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
— We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theo...
WCRE
2009
IEEE
14 years 2 months ago
2009
IEEE
—Code smells are poor implementation choices, thought to make object-oriented systems hard to maintain. In this study, we investigate if classes with code smells are more change-...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
-- The importance of within-die process variation and its impact on product yield has increased significantly with scaling. Within-die variation is typically monitored by embedding...
ICSE
1999
IEEE-ACM
13 years 11 months ago
1999
IEEE-ACM
Structural coverage criteria are often used as an indicator of the thoroughness of testing, but complete satisfaction of a criterion is seldom achieved. When a software product is...
ICIP
2001
IEEE
14 years 9 months ago
2001
IEEE
In this paper, we propose a word shape recognition method for retrieving image-based documents. Document images are segmented at the word level first. Then the proposed method det...