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ICCAD
2006
IEEE
127views Hardware» more  ICCAD 2006»
14 years 4 months ago
Importance of volume discretization of single and coupled interconnects
This paper presents figures of merit and error formulae to determine which interconnects require volume discretization in the GHZ range. Most of the previous work focused mainly o...
Ahmed Shebaita, Dusan Petranovic, Yehea I. Ismail
ASPDAC
2007
ACM
144views Hardware» more  ASPDAC 2007»
13 years 11 months ago
Parameter Reduction for Variability Analysis by Slice Inverse Regression (SIR) Method
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
ICCAD
2010
IEEE
126views Hardware» more  ICCAD 2010»
13 years 5 months ago
Characterizing the lifetime reliability of manycore processors with core-level redundancy
With aggressive technology scaling, integrated circuits suffer from everincreasing wearout effects and their lifetime reliability has become a serious concern for the industry. Fo...
Lin Huang, Qiang Xu
ISPD
2004
ACM
134views Hardware» more  ISPD 2004»
14 years 29 days ago
Performance-driven register insertion in placement
As the CMOS technology is scaled into the dimension of nanometer, the clock frequencies and die sizes of ICs are shown to be increasing steadily [5]. Today, global wires that requ...
Dennis K. Y. Tong, Evangeline F. Y. Young
TVLSI
2008
150views more  TVLSI 2008»
13 years 7 months ago
Data Memory Subsystem Resilient to Process Variations
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance o...
M. Bennaser, Yao Guo, Csaba Andras Moritz