Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
Michael A. Kochte, Marcel Schaal, Hans-Joachim Wun...
The performance of out-of-order processors increases with the instruction window size. In conventional processors, the effective instruction window cannot be larger than the issue...
In a component-based system components are basic computation units implementing specific business functions, and their interactions are explicitly represented by connectors. If th...
We propose and evaluate a novel approach for automatic parallelization. The approach uses traces as units of parallel work. We discuss the benefits and challenges of the use of t...
Automatic test data generation leads to the identification of input values on which a selected path or a selected branch is executed within a program (path-oriented vs goalorient...