We propose the notion of logical reliability for real-time program tasks that interact through periodically updated program variables. We describe a reliability analysis that chec...
Krishnendu Chatterjee, Arkadeb Ghosal, Thomas A. H...
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
Combinational or Classical logic circuits dissipate heat for every bit of information that is lost. Information is lost when the input vector cannot be recovered from its correspon...
Md. Saiful Islam 0003, Muhammad Mahbubur Rahman, Z...
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
A method is developed to infer a polymorphic well-typing for a logic program. Our motivation is to improve the automation of termination analysis by deriving types from which norms...
Maurice Bruynooghe, John P. Gallagher, Wouter Van ...