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EGITALY
2006
13 years 11 months ago
Easy Access to Huge 3D Models of Works of Art
Automatic shape acquisition technologies evolved rapidly in recent years, and huge mass of 3D data can be easily produced. The high accuracy of range scanning technology makes the...
Marco Callieri, Federico Ponchio, Paolo Cignoni, R...
DAC
2010
ACM
13 years 10 months ago
QuickYield: an efficient global-search based parametric yield estimation with performance constraints
With technology scaling down to 90nm and below, many yield-driven design and optimization methodologies have been proposed to cope with the prominent process variation and to incr...
Fang Gong, Hao Yu, Yiyu Shi, Daesoo Kim, Junyan Re...
DAC
2002
ACM
14 years 10 months ago
Combined BEM/FEM substrate resistance modeling
For present-day micro-electronic designs, it is becoming ever more important to accurately model substrate coupling effects. Basically, either a Finite Element Method (FEM) or a B...
Eelco Schrik, N. P. van der Meijs
DFT
2005
IEEE
92views VLSI» more  DFT 2005»
14 years 3 months ago
Simulating Faults of Combinational IP Core-based SOCs in a PLI Environment
This paper presents a new test methodology which utilizes the Programming Language Interface (PLI) for performing fault simulation of combinational or full scan Intellectual Prope...
Pedram A. Riahi, Zainalabedin Navabi, Fabrizio Lom...
FGR
2006
IEEE
121views Biometrics» more  FGR 2006»
14 years 3 months ago
Preliminary Face Recognition Grand Challenge Results
The goal of the Face Recognition Grand Challenge (FRGC) is to improve the performance of face recognition algorithms by an order of magnitude over the best results in Face Recogni...
P. Jonathon Phillips, Patrick J. Flynn, W. Todd Sc...