214 search results - page 7 / 43 » Improved Boundary Scan Design |
IOLTS
2006
IEEE
14 years 3 months ago
2006
IEEE
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
ERCIMDL
2009
Springer
14 years 4 months ago
2009
Springer
This paper describes a work-flow designed to populate a digital library of ancient Greek critical editions with highly accurate OCR scanned text. While the most recently available...
FCCM
2009
IEEE
14 years 4 months ago
2009
IEEE
BLASTn is a tool universally used by biologists to identify similarities between nucleotide based biological genome sequences. This report describes an FPGA based hardware impleme...
ICCAD
1996
IEEE
14 years 2 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
ICIP
2008
IEEE
14 years 11 months ago
2008
IEEE
We pose the problem of perfect segmentation for regions with ambiguous boundaries. We design machine learning classifiers to identify boundaries and build these into an interactiv...