525 search results - page 6 / 105 » Improved Circular Layouts |
WWW
2004
ACM
14 years 8 months ago
2004
ACM
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
Path delay fault testing becomes increasingly important due to higher clock rates and higher process variability caused by shrinking geometries. Achieving high-coverage path delay...
ISPD
2006
ACM
14 years 1 months ago
2006
ACM
CCCG
2007
13 years 8 months ago
2007
In a previous paper, Calamoneri and Massini studied the problem of drawing the multigrid network in “a grid of minimum area”. In this paper we show that we can draw the multig...
ECEASST
2008
13 years 7 months ago
2008
