Path delay fault testing becomes increasingly important due to higher clock rates and higher process variability caused by shrinking geometries. Achieving high-coverage path delay...
Puneet Gupta, Andrew B. Kahng, Ion I. Mandoiu, Pun...
In a previous paper, Calamoneri and Massini studied the problem of drawing the multigrid network in “a grid of minimum area”. In this paper we show that we can draw the multig...