2201 search results - page 185 / 441 » Improvement of ASIC Design Processes |
131
Voted
DAC
2007
ACM
16 years 4 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
99
Voted
DAC
2009
ACM
16 years 4 months ago
2009
ACM
For a number of years, dataflow concepts have provided designers of digital signal processing systems with environments capable of expressing high-level software architectures as ...
125
Voted
ICCAD
2005
IEEE
16 years 17 days ago
2005
IEEE
— Variability in the chip design process has been relatively increasing with technology scaling to smaller dimensions. Using worst case analysis for circuit optimization severely...
131
Voted
DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
— The worst-case delay/power of function units has been used in traditional high level synthesis to facilitate design space exploration. As technology scales to nanometer regime,...
121
Voted
DSRT
2008
IEEE
15 years 10 months ago
2008
IEEE
This paper describes a new property checking approach in order to enhance the diagnosis ability of an electronic embedded system, included in an automotive application. We conside...