— The use of dynamic voltage and frequency scaling (DVFS) in contemporary multicores provides significant protection from unpredictable thermal events. A side effect of DVFS can ...
Ramakrishna Vadlamani, Jia Zhao, Wayne P. Burleson...
Abstract--This paper addresses reliability of data dissemination applications when there are severe disruptions to the underlying physical infrastructure. Such massive simultaneous...
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
Erika Gunadi, Abhishek A. Sinkar, Nam Sung Kim, Mi...
As a recently proposed technique, sparse representation based classification (SRC) has been widely used for face recognition (FR). SRC first codes a testing sample as a sparse lin...
Modern out-of-order processors tolerate long latency memory operations by supporting a large number of inflight instructions. This is particularly useful in numerical applications...