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TVLSI
2010
13 years 2 months ago
Test Data Compression Using Efficient Bitmask and Dictionary Selection Methods
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
Kanad Basu, Prabhat Mishra
WADS
2005
Springer
95views Algorithms» more  WADS 2005»
14 years 1 months ago
Improved Combinatorial Group Testing for Real-World Problem Sizes
We study practically efficient methods for performing combinatorial group testing. We present efficient non-adaptive and two-stage combinatorial group testing algorithms, which i...
David Eppstein, Michael T. Goodrich, Daniel S. Hir...
ICMCS
2007
IEEE
145views Multimedia» more  ICMCS 2007»
14 years 1 months ago
An Interactive 3D Environment for Computer Based Education
Individual learning capabilities can vary from gifted to exceptionally slow; some students may take longer to understand a concept and may not be able to achieve the expected stan...
Gang Wu, Irene Cheng
HICSS
2009
IEEE
103views Biometrics» more  HICSS 2009»
13 years 11 months ago
Automated Acceptance Testing Using Fit
Automated acceptance testing is a new and promising agile testing approach. Fit is the most established technical framework for specifying and executing acceptance tests which, id...
Geir Kjetil Hanssen, Børge Haugset
ECTEL
2009
Springer
14 years 2 months ago
How Much Assistance Is Helpful to Students in Discovery Learning?
How much help helps in discovery learning? This question is one instance of the assistance dilemma, an important issue in the learning sciences and educational technology research....
Alexander Borek, Bruce M. McLaren, Michael Karabin...