Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
We study practically efficient methods for performing combinatorial group testing. We present efficient non-adaptive and two-stage combinatorial group testing algorithms, which i...
David Eppstein, Michael T. Goodrich, Daniel S. Hir...
Individual learning capabilities can vary from gifted to exceptionally slow; some students may take longer to understand a concept and may not be able to achieve the expected stan...
Automated acceptance testing is a new and promising agile testing approach. Fit is the most established technical framework for specifying and executing acceptance tests which, id...
How much help helps in discovery learning? This question is one instance of the assistance dilemma, an important issue in the learning sciences and educational technology research....
Alexander Borek, Bruce M. McLaren, Michael Karabin...