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» Improving Testing Efficiency using Cumulative Test Analysis
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VLSID
2002
IEEE
95views VLSI» more  VLSID 2002»
14 years 7 months ago
A Novel Method to Improve the Test Efficiency of VLSI Tests
This paper considers reducing the cost of test application by permuting test vectors to improve their defect coverage. Algorithms for test reordering are developed with the goal o...
Hailong Cui, Sharad C. Seth, Shashank K. Mehta
GECCO
2008
Springer
172views Optimization» more  GECCO 2008»
13 years 8 months ago
Empirical analysis of a genetic algorithm-based stress test technique
Evolutionary testing denotes the use of evolutionary algorithms, e.g., Genetic Algorithms (GAs), to support various test automation tasks. Since evolutionary algorithms are heuris...
Vahid Garousi
GECCO
2006
Springer
162views Optimization» more  GECCO 2006»
13 years 11 months ago
Improving evolutionary real-time testing
Embedded systems are often used in a safety-critical context, e.g. in airborne or vehicle systems. Typically, timing constraints must be satisfied so that real-time embedded syste...
Marouane Tlili, Stefan Wappler, Harmen Sthamer
ICIP
2006
IEEE
14 years 9 months ago
Fusion of Visible and Infrared Images using Empirical Mode Decomposition to Improve Face Recognition
In this effort, we propose a new image fusion technique, utilizing Empirical Mode Decomposition (EMD), for improved face recognition. EMD is a non-parametric datadriven analysis t...
Harishwaran Hariharan, Andreas Koschan, Besma R. A...