1117 search results - page 44 / 224 » Improving Testing Efficiency using Cumulative Test Analysis |
140
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JCIT
2010
14 years 9 months ago
2010
With the development of telecom business, customer churn prediction becomes more and more important. An outstanding issue in customer churn prediction is high dimensional problem....
123
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DAC
2007
ACM
16 years 3 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
128
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BMCBI
2004
15 years 2 months ago
2004
Background: A key step in the analysis of microarray expression profiling data is the identification of genes that display statistically significant changes in expression signals ...
111
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PVLDB
2010
14 years 9 months ago
2010
In this paper, we tackle the problem of efficient skycube computation. We introduce a novel approach significantly reducing domination tests for a given subspace and the number of...
118
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MICRO
2006
IEEE
15 years 8 months ago
2006
IEEE
Dynamic software bug detection tools are commonly used because they leverage run-time information. However, they suffer from a fundamental limitation, the Path Coverage Problem: t...