1117 search results - page 4 / 224 » Improving Testing Efficiency using Cumulative Test Analysis |
JSA
2011
13 years 2 months ago
2011
SIGSOFT
2006
ACM
14 years 1 months ago
2006
ACM
Repeated changes to a software system can introduce small weaknesses such as unplanned dependencies between different parts of the system. While such problems usually go undetecte...
TVLSI
2010
13 years 2 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
SIGSOFT
2008
ACM
14 years 8 months ago
2008
ACM
Many testing and analysis techniques have been developed for inhouse use. Although they are effective at discovering defects before a program is deployed, these techniques are oft...
WSC
1998
1998
Effective Implementation of Cycle Time Reduction Strategies for Semiconductor Back-end Manufacturing
13 years 8 months ago
Using discrete-event simulation models, a study was conducted to evaluate the current production practices of a high-volume semiconductor back-end operation. The overall goal was ...