259 search results - page 17 / 52 » Improving architecture testability with patterns |
ICSE
2003
IEEE-ACM
14 years 7 months ago
2003
IEEE-ACM
The knowledge required to develop complex software has historically existed in programming folklore, the heads of experienced developers, or buried deep in the code. These locatio...
DDECS
2006
IEEE
14 years 1 months ago
2006
IEEE
—Parallel memory modules can be used to increase memory bandwidth and feed a processor with only necessary data. Arbitrary stride access capability with interleaved memories is d...
DATE
2002
IEEE
14 years 10 days ago
2002
IEEE
In this paper, we investigate the benefits of a flexible, application-specific instruction set by adding a run-time Reconfigurable Functional Unit (RFU) to a VLIW processor. Preli...
CODES
2008
IEEE
14 years 1 months ago
2008
IEEE
Modern embedded compute platforms increasingly contain both microprocessors and field-programmable gate arrays (FPGAs). The FPGAs may implement accelerators or other circuits to s...
DAC
2009
ACM
14 years 8 months ago
2009
ACM
In double patterning lithography (DPL), coloring conflict and stitch minimization are the two main challenges. Post layout decomposition algorithm [1] [2]may not be enough to achi...