259 search results - page 36 / 52 » Improving architecture testability with patterns |
ISCA
2011
IEEE
12 years 11 months ago
2011
IEEE
Emerging memory technologies such as STT-RAM, PCRAM, and resistive RAM are being explored as potential replacements to existing on-chip caches or main memories for future multi-co...
ADBIS
1995
Springer
13 years 11 months ago
1995
Springer
Crash recovery in database systems aims to provide an acceptable level of protection from failure at a given engineering cost. A large number of recovery mechanisms are known, and...
DAC
2008
ACM
14 years 8 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
IPPS
2009
IEEE
14 years 2 months ago
2009
IEEE
As the number of cores per machine increases, memory architectures are being redesigned to avoid bus contention and sustain higher throughput needs. The emergence of Non-Uniform M...
DFT
2008
IEEE
14 years 1 months ago
2008
IEEE
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...