259 search results - page 12 / 52 » Improving coverage analysis and test generation for large de... |
ICSEA
2007
IEEE
14 years 1 months ago
2007
IEEE
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...
CSB
2003
IEEE
14 years 24 days ago
2003
IEEE
DNA microarrays are a valuable tool for massively parallel DNA-DNA hybridization experiments. Currently, most applications rely on the existence of sequence-specific oligonucleot...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
GECCO
2006
Springer
13 years 11 months ago
2006
Springer
Embedded systems are often used in a safety-critical context, e.g. in airborne or vehicle systems. Typically, timing constraints must be satisfied so that real-time embedded syste...