259 search results - page 21 / 52 » Improving coverage analysis and test generation for large de... |
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— Clock meshes posses inherent low clock skews and excellent immunity to PVT variations, and have increasingly found their way to high-performance IC designs. However, analysis o...
SP
2008
IEEE
14 years 1 months ago
2008
IEEE
Attacks often exploit memory errors to gain control over the execution of vulnerable programs. These attacks remain a serious problem despite previous research on techniques to pr...
SAC
2004
ACM
14 years 29 days ago
2004
ACM
Web applications have become complex and crucial for many firms, especially when combined with areas such as CRM (Customer Relationship Management) and BPR (Business Process Reen...
ASPDAC
2004
ACM
13 years 11 months ago
2004
ACM
The design of complex systems is largely ruled by the time needed for verification. Even though formal methods can provide higher reliability, in practice often simulation based ve...