259 search results - page 9 / 52 » Improving coverage analysis and test generation for large de... |
COMPSAC
2007
IEEE
13 years 11 months ago
2007
IEEE
Despite the availability of a variety of program analysis tools, evaluation of these tools is difficult, as only few benchmark suites exist. Existing benchmark suites lack the uni...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
KR
2000
Springer
13 years 11 months ago
2000
Springer
Large-scale ontologies are becoming an essential component of many applications including standard search (such as Yahoo and Lycos), ecommerce (such as Amazon and eBay), configura...
EMSOFT
2008
Springer
13 years 9 months ago
2008
Springer
The Simulink/Stateflow (SL/SF) environment from Mathworks is becoming the de facto standard in industry for model based development of embedded control systems. Many commercial to...
ICCAD
2000
IEEE
13 years 12 months ago
2000
IEEE
computation and automatic abstraction. Second, Ketchum performs not only automatic test generation but also unreachability analysis, which enables the test generation effort to be ...