We propose a novel approach to improve the distinctiveness of local image features without significantly affecting their robustness with respect to image deformations. Local image...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
Substantial increase in leakage current and threshold voltage fluctuations are making design of robust wide fan-in dynamic gates a challenging task. Traditionally, a PMOS keeper t...
Hamed F. Dadgour, Rajiv V. Joshi, Kaustav Banerjee
While mutual information-based methods have become popular for image registration, the question of what underlying feature to use is rarely discussed. Instead, it is implicitly as...
In traditional text clustering methods, documents are represented as "bags of words" without considering the semantic information of each document. For instance, if two ...
Xiaohua Hu, Xiaodan Zhang, Caimei Lu, E. K. Park, ...