37 search results - page 1 / 8 » Improving the accuracy of diagnostics provided by fault dict... |
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
ICCD
2002
IEEE
14 years 14 days ago
2002
IEEE
The exceedingly large size of fault dictionaries constitutes a fundamental obstacle to their usage. We outline a new method to reduce significantly the size of fault dictionaries...
ISQED
2003
IEEE
14 years 24 days ago
2003
IEEE
We present a new technique for generating compact dictionaries for cause-effect diagnosis in BIST. This approach relies on the use of three compact dictionaries: (i) D1, containin...
PROMISE
2010
13 years 2 months ago
2010
Background: Automated diagnosis of software defects can drastically increase debugging efficiency, improving reliability and time-to-market. Current, low-cost, automatic fault dia...
ICCAD
2000
IEEE
13 years 12 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...