39 search results - page 4 / 8 » Improving yield and reliability of chip multiprocessors |
TC
2010
13 years 6 months ago
2010
—The number of CPUs in chip multiprocessors is growing at the Moore’s Law rate, due to continued technology advances. However, new technologies pose serious reliability challen...
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— As technology scales, the delay uncertainty caused by process variations has become increasingly pronounced in deep submicron designs. As a result, a paradigm shift from determ...
ASAP
2008
IEEE
14 years 2 months ago
2008
IEEE
As semiconductor processing technology continues to scale down, managing reliability becomes an increasingly difficult challenge in high-performance microprocessor design. Transie...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
With the ever-increasing transistor variability in CMOS technology, it is essential to integrate variation-aware performance analysis into the task allocation and scheduling proce...
TCAD
2008
13 years 7 months ago
2008
As the technology node advances into the nanometer era, via-open defects are one of the dominant failures due to the copper cladding process. To improve via yield and reliability, ...