295 search results - page 5 / 59 » In-Parameter-Order: A Test Generation Strategy for Pairwise ... |
151
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ICRA
2010
IEEE
15 years 4 months ago
2010
IEEE
— This paper presents the development of a biomechatronic knee prosthesis for transfemoral amputees. This kind of prostheses are considered ‘intelligent’ because they are abl...
174
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DATE
1999
IEEE
15 years 9 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
190
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ICMT
2009
Springer
16 years 2 days ago
2009
Springer
Testing model transformations requires input models which are graphs of inter-connected objects that must conform to a meta-model and meta-constraints from heterogeneous sources su...
194
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ATS
1998
IEEE
15 years 9 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
161
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AMOST
2005
ACM
15 years 11 months ago
2005
ACM
The combinatorial approach to software testing uses models to generate a minimal number of test inputs so that selected combinations of input values are covered. The most common c...