295 search results - page 5 / 59 » In-Parameter-Order: A Test Generation Strategy for Pairwise ... |
ICRA
2010
IEEE
13 years 7 months ago
2010
IEEE
— This paper presents the development of a biomechatronic knee prosthesis for transfemoral amputees. This kind of prostheses are considered ‘intelligent’ because they are abl...
DATE
1999
IEEE
14 years 1 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
ICMT
2009
Springer
14 years 3 months ago
2009
Springer
Testing model transformations requires input models which are graphs of inter-connected objects that must conform to a meta-model and meta-constraints from heterogeneous sources su...
ATS
1998
IEEE
14 years 29 days ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
AMOST
2005
ACM
14 years 2 months ago
2005
ACM
The combinatorial approach to software testing uses models to generate a minimal number of test inputs so that selected combinations of input values are covered. The most common c...