137 search results - page 4 / 28 » Increasing the Efficiency of Fault Detection in Modified Cod... |
DAC
2009
ACM
14 years 8 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
－ We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and cr...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
ICDCS
1999
IEEE
13 years 11 months ago
1999
IEEE
With the increasing complexity of large-scale distributed (LSD) systems, an efficient monitoring mechanism has become an essential service for improving the performance and reliab...
DFT
2000
IEEE
13 years 11 months ago
2000
IEEE
1 Over the last years, an increasing number of safety-critical tasks have been demanded to computer systems. In particular, safety-critical computer-based applications are hitting ...