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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 2 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
BMCBI
2005
103views more  BMCBI 2005»
13 years 7 months ago
Quadratic regression analysis for gene discovery and pattern recognition for non-cyclic short time-course microarray experiments
Background: Cluster analyses are used to analyze microarray time-course data for gene discovery and pattern recognition. However, in general, these methods do not take advantage o...
Hua Liu, Sergey Tarima, Aaron S. Borders, Thomas V...
IPMI
2001
Springer
14 years 8 months ago
Deformation Analysis for Shape Based Classification
Statistical analysis of anatomical shape differences between two different populations can be reduced to a classification problem, i.e., learning a classifier function for assignin...
Polina Golland, W. Eric L. Grimson, Martha Elizabe...
SSPR
2004
Springer
14 years 1 months ago
Finding Clusters and Components by Unsupervised Learning
We present a tutorial survey on some recent approaches to unsupervised machine learning in the context of statistical pattern recognition. In statistical PR, there are two classica...
Erkki Oja
CHI
2007
ACM
14 years 8 months ago
The life and death of online gaming communities: a look at guilds in world of warcraft
Massively multiplayer online games (MMOGs) can be fascinating laboratories to observe group dynamics online. In particular, players must form persistent associations or "guil...
Nicolas Ducheneaut, Nicholas Yee, Eric Nickell, Ro...