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TII
2008
109views more  TII 2008»
13 years 9 months ago
Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio L...
ICCAD
1999
IEEE
84views Hardware» more  ICCAD 1999»
14 years 1 months ago
Improving coverage analysis and test generation for large designs
State space techniques have proven to be useful for measuring and improving the coverage of test vectors that are used during functional validation via simulation. By comparing th...
Jules P. Bergmann, Mark Horowitz
NIPS
2004
13 years 10 months ago
Result Analysis of the NIPS 2003 Feature Selection Challenge
The NIPS 2003 workshops included a feature selection competition organized by the authors. We provided participants with five datasets from different application domains and calle...
Isabelle Guyon, Steve R. Gunn, Asa Ben-Hur, Gideon...
MTV
2005
IEEE
81views Hardware» more  MTV 2005»
14 years 2 months ago
Search-Space Optimizations for High-Level ATPG
Our mutation based validation paradigm (MVP) is a validation environment for high-level microprocessor implementations. To be able to efficiently identify and analyze the architec...
Jorge Campos, Hussain Al-Asaad
DAC
2008
ACM
14 years 10 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...