We present a mathematical model for the problem of scheduling tests for core-based system-on-chip (SOC) VLSI designs. Given a set of tests for each core in the SOC and a set of te...
Success of Wireless Sensor Networks largely depends whether the deployed network can provide desired coverage with acceptable network lifetime. This paper proposes a distributed pr...
In this paper, we present a methodology for designing a pipeline of accelerators for an application. The application is modeled using sequential C language with simple stylization...
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
In the multilevel generalized assignment problem (MGAP) agents can perform tasks at more than one efficiency level. Important manufacturing problems, such as lot sizing, can be ea...