In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
To take the first step beyond keyword-based search toward entity-based search, suitable token spans ("spots") on documents must be identified as references to real-world...
Sayali Kulkarni, Amit Singh, Ganesh Ramakrishnan, ...
As Double Patterning Lithography(DPL) becomes the leading candidate for sub-30nm lithography process, we need a fast and lithography friendly decomposition framework. In this pape...
Jae-Seok Yang, Katrina Lu, Minsik Cho, Kun Yuan, D...
Many optimization techniques, including several targeted specifically at embedded systems, depend on the ability to calculate the number of elements that satisfy certain conditio...
Sven Verdoolaege, Rachid Seghir, Kristof Beyls, Vi...
Abstract. Data centric languages, such as recursive rule based languages, have been proposed to program distributed applications over networks. They simplify greatly the code, whic...