412 search results - page 42 / 83 » Integrating customized test requirements with traditional re... |
ACMICEC
2004
ACM
14 years 2 months ago
2004
ACM
Many companies have found out the hard way that successful ecommerce requires more than a flashy web presence. Existing business processes must be seamlessly integrated with the n...
ICCD
2007
IEEE
14 years 5 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
— Ubiquitous image processing tasks (such as transform decompositions, filtering and motion estimation) do not currently provide graceful degradation when their clock-cycles budg...
DSN
2002
IEEE
14 years 1 months ago
2002
IEEE
—Advanced automotive control applications such as steer-by-wire are typically implemented as distributed systems comprising many embedded processors, sensors, and actuators inter...
DLOG
2003
13 years 10 months ago
2003
In this paper, we investigate the use of Description Logic (DL) for representing Product Behavioral constraints in Computer Aided Design (CAD) Systems. In an integrated design app...