412 search results - page 6 / 83 » Integrating customized test requirements with traditional re... |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
ICSE
2011
IEEE-ACM
12 years 11 months ago
2011
IEEE-ACM
Current practice in testing JavaScript web applications requires manual construction of test cases, which is difficult and tedious. We present a framework for feedback-directed a...
ICWS
2010
IEEE
13 years 6 months ago
2010
IEEE
The service-oriented approach is becoming more and more popular to integrate highly heterogeneous systems. Web services are the natural evolution of conventional middleware techno...
KBSE
2006
IEEE
14 years 1 months ago
2006
IEEE
The testing of database applications poses new challenges for software engineers. In particular, it is difficult to thoroughly test the interactions between an application and it...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
The traditionally wired interfaces of many electronic systems are in many applications being replaced by wireless interfaces. Testing of electronic systems (both integrated circui...