81 search results - page 13 / 17 » Intelligent Selection of Fault Tolerance Techniques on the G... |
HPDC
2010
IEEE
13 years 6 months ago
2010
IEEE
Parallel computing on volatile distributed resources requires schedulers that consider job and resource characteristics. We study unconventional computing environments containing ...
DAC
2006
ACM
14 years 7 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
HPCA
2006
IEEE
14 years 7 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
SBCCI
2009
ACM
14 years 1 months ago
2009
ACM
The purpose of this work is the proposal of a 10-Bit / 1 MSPS Analog to Digital Converter (ADC) with error correction to match the requirements of a CMOS wavefront sensor for opht...
SECON
2007
IEEE
14 years 29 days ago
2007
IEEE
—We consider surveillance applications in which sensors are deployed in large numbers to improve coverage fidelity. Previous research has studied how to select active sensor cov...