481 search results - page 1 / 97 » Interactive Simulation of Burning Objects |
PG
2003
IEEE
14 years 4 months ago
2003
IEEE
In this paper we describe a fast and interactive method for simulating and controlling the combustion process together with the decomposition of burning solids. The combustion and...
SMA
2005
ACM
14 years 4 months ago
2005
ACM
For simulations involving complex objects, a number of different properties must be represented. An example of this is in modeling an object undergoing combustion—heat amounts,...
DATE
2008
IEEE
14 years 5 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
VTS
2008
IEEE
14 years 5 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
TVCG
2010
13 years 9 months ago
2010
— This paper presents topology-based methods to robustly extract, analyze, and track features defined as subsets of isosurfaces. First, we demonstrate how features identified b...