138 search results - page 9 / 28 » Interval-valued reduced order statistical interconnect model... |
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
GLVLSI
2008
IEEE
14 years 1 months ago
2008
IEEE
In this paper, we propose a novel statistical capacitance extraction method for interconnects considering process variations. The new method, called statCap, is based on the spect...
DASFAA
2004
IEEE
13 years 11 months ago
2004
IEEE
Data mining is a process that analyzes voluminous digital data in order to discover hidden but useful patterns from digital data. However, discovery of such hidden patterns has sta...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
— New back-end design for manufacturability rules have brought guarantee rules for interconnect matching. These rules indicate a certain capacitance matching guarantee given spac...
KDD
2006
ACM
14 years 7 months ago
2006
ACM
Mining frequent patterns is a general and important issue in data mining. Complex and unstructured (or semi-structured) datasets have appeared in major data mining applications, i...