Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the inte...
In this work we propose an online reliability tracking framework that utilizes a hybrid network of on-chip temperature and delay sensors together with a circuit reliability macrom...
Global Computing achieves high throughput computing by harvesting a very large number of unused computing resources connected to the Internet. This parallel computing model target...
In control systems the jitter is a major problem since in a time-varying system the theoretical results for analysis and design of time-invariant systems cannot be used directly. ...
Thomas Losert, Wilfried Elmenreich, Martin Schlage...