402 search results - page 66 / 81 » Is the island model fault tolerant |
MICRO
2006
IEEE
13 years 8 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
FPGA
2009
ACM
14 years 3 months ago
2009
ACM
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the inte...
GLVLSI
2009
IEEE
14 years 3 months ago
2009
IEEE
In this work we propose an online reliability tracking framework that utilizes a hybrid network of on-chip temperature and delay sensors together with a circuit reliability macrom...
CCGRID
2001
IEEE
14 years 14 days ago
2001
IEEE
Global Computing achieves high throughput computing by harvesting a very large number of unused computing resources connected to the Internet. This parallel computing model target...
CIIT
2004
13 years 10 months ago
2004
In control systems the jitter is a major problem since in a time-varying system the theoretical results for analysis and design of time-invariant systems cannot be used directly. ...