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DDECS
2007
IEEE
90views Hardware» more  DDECS 2007»
14 years 2 months ago
Test Pattern Generator for Delay Faults
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
Tomasz Rudnicki, Andrzej Hlawiczka
ECLIPSE
2007
ACM
14 years 2 months ago
Predicting buggy changes inside an integrated development environment
We present a tool that predicts whether the software under development inside an IDE has a bug. An IDE plugin performs this prediction, using the Change Classification technique t...
Janaki T. Madhavan, E. James Whitehead Jr.
ECOOPW
2007
Springer
14 years 2 months ago
Enabling Software Evolution Via AOP and Reflection
Following last three years' RAM-SE (Reflection, AOP and Meta-Data for Software Evolution) workshop at the ECOOP conference, the RAM-SE'07 workshop was a successful and po...
Manuel Oriol, Walter Cazzola, Shigeru Chiba, Gunte...
ELPUB
2007
ACM
14 years 2 months ago
Towards an Ontology of ElPub/SciX: A Proposal
A proposal is presented for a standard ontology language defined as ElPub/SciX Ontology, based on the content of a web digital library of conference proceedings. This content, i.e...
Sely Maria de Souza Costa, Cláudio Gottscha...
ICDCS
2010
IEEE
14 years 2 months ago
New Algorithms for Planning Bulk Transfer via Internet and Shipping Networks
—Cloud computing is enabling groups of academic collaborators, groups of business partners, etc., to come together in an ad-hoc manner. This paper focuses on the group-based data...
Brian Cho, Indranil Gupta