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128
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DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
116
Voted
VTC
2007
IEEE
15 years 10 months ago
2007
IEEE
— We propose a novel bit error ratio (BER) analysis technique for fast frequency hopping (FFH) assisted M-ary frequency shift keying (MFSK) using product combining (PC), when the...
121
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ASIACRYPT
2001
Springer
15 years 8 months ago
2001
Springer
Abstract. We give a careful, fixed-size parameter analysis of a standard [1,4] way to form a pseudorandom generator by iterating a one-way function and then pseudo-random function...
123
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DBPL
2007
Springer
15 years 10 months ago
2007
Springer
Abstract. Provenance is information recording the source, derivation, or history of some information. Provenance tracking has been studied in a variety of settings; however, althou...
96
Voted
VTC
2006
IEEE
15 years 9 months ago
2006
IEEE
— In this contribution, we analyze the bit error rate (BER) performance of fast frequency hopping (FFH) assisted M-ary frequency shift keying (MFSK) using product combining. Prod...