Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
Xiaoning Qi, Alex Gyure, Yansheng Luo, Sam C. Lo, ...
This paper introduces a novel low-power digital future, are expected to run at frequencies beyond 10 MHz. In controller for high frequency dc-dc switch-mode power supplies addition...
This paper shows a method to verifying the thermal status of complex FPGA-based circuits like microprocessors. Thus, the designer can evaluate if a particular block is working bey...
—Design optimization methodologies for AMS-SoCs with analog, digital, and mixed-signal portions have not received significant attention, due to their high complexity. In mixed-s...
Oleg Garitselov, Saraju P. Mohanty, Elias Kougiano...