1295 search results - page 132 / 259 » Layered manufacturing technologies |
114
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ICCAD
2007
IEEE
16 years 1 months ago
2007
IEEE
— As nanometer technology advances, the post-CMP dielectric thickness variation control becomes crucial for manufacturing closure. To improve CMP quality, dummy feature filling ...
130
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ICCAD
2004
IEEE
16 years 1 months ago
2004
IEEE
— In deep sub-micron technologies, process variations can cause significant path delay and clock skew uncertainties thereby lead to timing failure and yield loss. In this paper,...
221
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AICT
2009
IEEE
15 years 11 months ago
2009
IEEE
Unlike other wireless technologies, the deployment of 802.11 networks is not limited to operators: access points can easily be installed by end-users for domestic use. This singul...
125
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FC
2009
Springer
15 years 10 months ago
2009
Springer
Abstract. A certificate of authenticity (COA) is an inexpensive physical object with a random and unique structure S which is hard to nearexactly replicate. An inexpensive device ...
136
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SIGCOMM
2009
ACM
15 years 10 months ago
2009
ACM
The creation of services on IP networks is a lengthy process. The development time is further increased if this involves the equipment manufacturer adding third-party technology i...