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ASPDAC
2006
ACM
129views Hardware» more  ASPDAC 2006»
14 years 3 months ago
Yield-area optimizations of digital circuits using non-dominated sorting genetic algorithm (YOGA)
With shrinking technology, the timing variation of a digital circuit is becoming the most important factor while designing a functionally reliable circuit. Gate sizing has emerged...
Vineet Agarwal, Janet Meiling Wang
ISLPED
2006
ACM
119views Hardware» more  ISLPED 2006»
14 years 2 months ago
Process variation aware cache leakage management
In a few technology generations, limitations of fabrication processes will make accurate design time power estimates a daunting challenge. Static leakage current which comprises a...
Ke Meng, Russ Joseph
W4A
2006
ACM
14 years 2 months ago
Use of RSS feeds for content adaptation in mobile web browsing
While mobile phones are becoming more popular, wireless communication vendors and device manufacturers are seeking new applications for their products. Access to the large corpus ...
Alexander Blekas, John D. Garofalakis, Vasilios St...
DATE
2005
IEEE
127views Hardware» more  DATE 2005»
14 years 2 months ago
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
ETFA
2005
IEEE
14 years 2 months ago
Designing usable decision support systems for HVM
In High Volume Manufacturing (HVM), system control is shared between automation and human workers. The social organisation of workers plays an important role in supporting human d...
Connor Upton, Gavin Doherty