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DAC
2008
ACM
14 years 10 months ago
TuneFPGA: post-silicon tuning of dual-Vdd FPGAs
Modern CMOS manufacturing processes have significant variability, which necessitates guard banding to achieve reasonable yield. We study an FPGA architecture with a dual voltage s...
Stephen Bijansky, Adnan Aziz
IFIP
2007
Springer
14 years 3 months ago
Global Supply Chain Control
The operation of global manufacturing network is challenging due to the complexity in product and information flow, diversity in sites, localization and processes and the informati...
Heidi C. Dreyer, Ottar Bakås, Erlend Alfnes,...
ICINCO
2004
122views Robotics» more  ICINCO 2004»
13 years 10 months ago
Data Security Considerations in Modern Automation Networks
: The automation manufacturing business has reached its turning point and manufacturers are forced to create new business areas. Their expertise about field devices will be the sou...
Mikko Salmenperä, Jari Seppälä
EUSFLAT
2009
194views Fuzzy Logic» more  EUSFLAT 2009»
13 years 7 months ago
A Fuzzy Particle Swarm Optimization Algorithm for a Cell Formation Problem
Group technology (GT) is a useful way to increase productivity with high quality in cellular manufacturing systems (CMSs), in which cell formation (CF) is a key step in the GT phil...
Esmaeil Mehdizadeh, Reza Tavakkoli-Moghaddam
ASPDAC
2006
ACM
116views Hardware» more  ASPDAC 2006»
14 years 3 months ago
Post-routing redundant via insertion for yield/reliability improvement
- Reducing the yield loss due to via failure is one of the important problems in design for manufacturability. A well known and highly recommended method to improve via yield/relia...
Kuang-Yao Lee, Ting-Chi Wang