25 search results - page 3 / 5 » Lazy Error Detection for Microprocessor Functional Units |
APCSAC
2005
IEEE
14 years 1 months ago
2005
IEEE
Increasing microprocessor vulnerability to soft errors induced by neutron and alpha particle strikes prevents aggressive scaling and integration of transistors in future technologi...
EDCC
1999
Springer
13 years 11 months ago
1999
Springer
The effects of variations in the workload input when estimating error detection coverage using fault injection are investigated. Results from scanchain implemented fault injection ...
EMSOFT
2005
Springer
14 years 29 days ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
APCSAC
2004
IEEE
13 years 11 months ago
2004
IEEE
As device sizes continue shrinking, lower charges are needed to activate gates, and consequently ever smaller external events (such as single ionizing particles of naturally occurr...
ISCA
2012
IEEE
11 years 10 months ago
2012
IEEE
Soft error reliability has become a first-order design criterion for modern microprocessors. Architectural Vulnerability Factor (AVF) modeling is often used to capture the probab...