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» Learning to Align: A Statistical Approach
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DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
14 years 1 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
AIRWEB
2007
Springer
14 years 1 months ago
Computing Trusted Authority Scores in Peer-to-Peer Web Search Networks
Peer-to-peer (P2P) networks have received great attention for sharing and searching information in large user communities. The open and anonymous nature of P2P networks is one of ...
Josiane Xavier Parreira, Debora Donato, Carlos Cas...
LCPC
2007
Springer
14 years 1 months ago
Modeling Relations between Inputs and Dynamic Behavior for General Programs
Program dynamic optimization, adaptive to runtime behavior changes, has become increasingly important for both performance and energy savings. However, most runtime optimizations o...
Xipeng Shen, Feng Mao
MSR
2006
ACM
14 years 1 months ago
Predicting defect densities in source code files with decision tree learners
With the advent of open source software repositories the data available for defect prediction in source files increased tremendously. Although traditional statistics turned out t...
Patrick Knab, Martin Pinzger, Abraham Bernstein
FOSSACS
2005
Springer
14 years 1 months ago
Branching Cells as Local States for Event Structures and Nets: Probabilistic Applications
We study the concept of choice for true concurrency models such as prime event structures and safe Petri nets. We propose a dynamic variation of the notion of cluster previously in...
Samy Abbes, Albert Benveniste