"Function Tokens" and "NOP Fills" are two methods proposed by various authors to deal with Instruction Pointer corruption in microcontrollers, especially in th...
While NAND flash memories have rapidly increased in both capacity and performance and are increasingly used as a storage device in many embedded systems, their reliability has de...
Abstract. We propose an efficient technique for the detection of errors in cryptographic circuits introduced by strong adversaries. Previously a number of linear and nonlinear err...
Zhen Wang, Mark G. Karpovsky, Berk Sunar, Ajay Jos...
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
Jangwoo Kim, Nikos Hardavellas, Ken Mai, Babak Fal...
A common way to model multiclass classification problems is by means of Error-Correcting Output Codes (ECOCs). Given a multiclass problem, the ECOC technique designs a code word fo...
Sergio Escalera, David M. J. Tax, Oriol Pujol, Pet...