A new Bayer pattern demosaicking scheme for single-sensor digital cameras is introduced. The raw output from a sensor, mostly a charge coupled device (CCD) or a complementary metal...
Rastislav Lukac, Konstantinos N. Plataniotis, Anas...
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
This paper presents a new appearance-based place recognition system for topological localization. The method uses a panoramic vision system to sense the environment. Color images ...
Shared mutable objects pose grave challenges in reasoning, especially for data abstraction and modularity. This paper presents a novel logic for erroravoiding partial correctness o...
Anindya Banerjee, David A. Naumann, Stan Rosenberg
A region-based matching approach is proposed for image correspondence of two images of the same scene but taken from different viewpoints. This approach consists of a matching sta...