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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 2 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
BIBE
2007
IEEE
129views Bioinformatics» more  BIBE 2007»
13 years 12 months ago
Statistial Analysis of nucleosome occupancy and histone modification data
Abstract-- In eukaryotic cells, genomic DNAs wrap around beadlike molecules, called nucleosomes, so as to pack more compactly in the nucleus of the cell. The nucleosome is made up ...
Guo-Cheng Yuan, Jun S. Liu
BMCBI
2008
177views more  BMCBI 2008»
13 years 8 months ago
Baseline Correction for NMR Spectroscopic Metabolomics Data Analysis
Background: We propose a statistically principled baseline correction method, derived from a parametric smoothing model. It uses a score function to describe the key features of b...
Yuanxin Xi, David M. Rocke
BMCBI
2005
152views more  BMCBI 2005»
13 years 7 months ago
Improved profile HMM performance by assessment of critical algorithmic features in SAM and HMMER
Background: Profile hidden Markov model (HMM) techniques are among the most powerful methods for protein homology detection. Yet, the critical features for successful modelling ar...
Markus Wistrand, Erik L. L. Sonnhammer
MM
2006
ACM
203views Multimedia» more  MM 2006»
14 years 1 months ago
Learning image manifolds by semantic subspace projection
In many image retrieval applications, the mapping between highlevel semantic concept and low-level features is obtained through a learning process. Traditional approaches often as...
Jie Yu, Qi Tian