Reliability of logic circuits is emerging as an important concern that may limit the benefits of continued scaling of process technology and the emergence of future technology al...
In the past, some researches suggested that engineers can use combined software reliability growth models (SRGMs) to obtain more accurate reliability prediction during testing. In...
Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential for runtime failure. Such failures range from intermittent electrical and mechan...
A histogram-based method for the interpretation of three-dimensional (3D) point clouds is introduced, where point clouds represent the surface of a scene of multiple objects and ba...
Information retrieval evaluation has typically been performed over several dozen queries, each judged to near-completeness. There has been a great deal of recent work on evaluatio...
Ben Carterette, Virgiliu Pavlu, Evangelos Kanoulas...