This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...
Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Tho...
Graphs are a common means to represent structures in models and meta-models of software systems. In this context, the description of model domains by classifying the domain entitie...
We present in this paper a system which automatically
builds, from real images, a scene model containing both
3D geometric information of the scene structure and its
photometric...
: We have developed a “WBS(Work Breakdown Structure) process model” for a business application software development project. We have also developed a project management system ...
In this paper, we suggest a linear programming formulation that allows for solving volume and capacity planning problems in semiconductor manufacturing systems. We assume a genera...